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FTIR, Raman and XRF Analyzer Spectrophotometer  Drawell 752N UVVIS
Spectrophotometer - Drawell 752N UV-VIS
752N UV-VIS Spectrophotometer been widely used in colleges and enterprises for general quantitative analysis and experiments based in absorbance measurements. High quality silicon photometric diode detector and 1200 lines/mm diffraction grating ensure the high quality accuracy and precision. Backlit LCD display for an easy readout. Automatic 0A and 100%T.
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FTIR, Raman and XRF Analyzer Spectrophotometer  Drawell L3 Split Beam VIS
Spectrophotometer - Drawell L3 Split Beam VIS
L3 Split Beam VIS Spectrophotometer survey optical system, and blazed holographic gratings. They have outstanding test precision and very competitive prices. and blazed holographic gratings. They have outstanding test precision and very competitive prices. 8-inch color touch-screen, cutting-edge user interface, powerful functions, and easy operation.
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FTIR, Raman and XRF Analyzer Spectrophotometer  Drawell L3S Split Beam VIS
Spectrophotometer - Drawell L3S Split Beam VIS
L3S Split Beam VIS Spectrophotometer survey optical system, and blazed holographic gratings. They have outstanding test precision and very competitive prices. and blazed holographic gratings. They have outstanding test precision and very competitive prices. 8-inch color touch-screen, cutting-edge user interface, powerful functions, and easy operation.
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FTIR, Raman and XRF Analyzer Spectrophotometer  Drawell N2 VIS
Spectrophotometer - Drawell N2 VIS
N2 VIS Spectrophotometer, being combined with an ARM processed core, has test speeds and functions possessed by high-end instruments. The instrument can meet the requirement of quantitative analysis for most samples conducted within the visible and ultraviolet-visible spectral range in conventional laboratories and is suitable for use in medicine and health, clinical examination, biochemical, petrochemical, environmental protection, quality control departments, colleges and universities and others.
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FTIR, Raman and XRF Analyzer Spectrophotometer  Drawell N2S VIS
Spectrophotometer - Drawell N2S VIS
N2S VIS Spectrophotometer, being combined with an ARM processed core, has test speeds and functions possessed by high-end instruments. The instrument can meet the requirement of quantitative analysis for most samples conducted within the visible and ultraviolet-visible spectral range in conventional laboratories and is suitable for use in medicine and health, clinical examination, biochemical, petrochemical, environmental protection, quality control departments, colleges and universities and others.
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FTIR, Raman and XRF Analyzer Spectrophotometer  Drawell DWAFS310 Atomic Fluorescence
Spectrophotometer - Drawell DW-AFS310 Atomic Fluorescence
The dual channel atomic fluorescence spectrometer is a carefully crafted precision analytical instrument. Widely used for trace and ultra trace analysis of 11 elements such as mercury (Hg),arsenic(As),antimony(Sb),bismuth (Bi),selenium (Se),tellurium(Te),cadmium (Cd),germanium (Ge),lead (Pb),tin (Sn), zinc (Zn),etc.,with compact volume,stable performance,and simple operation.
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FTIR, Raman and XRF Analyzer Spectrophotometer  Drawell DWAA4730FG Atomic Absorption
Spectrophotometer - Drawell DW-AA4730FG Atomic Absorption
Permanently equipped with both flame and graphite furnace atomize, switched by computer. Automatically determine the best position. Vertical 8 light stand, rotating light search by computer control, preheating and optimizing use conditions.
Total reflection optical system, using two aspherical optical elements to strictly correct astigmatism, effectively improve the monochromator entrance slit energy. Automatic wavelength scanning and peaking.
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FTIR, Raman and XRF Analyzer Spectrophotometer  Drawell Desktop XRF EDX2000A
Spectrophotometer - Drawell Desktop XRF EDX2000A
EDX2000A Automatic Micro-area Film Thickness Analyzer is a top-illuminate film thickness tester specially developed by Drawell, which best exemplifies its multiple years of layer film thickness measurement technology. Compared with the traditional coating thickness analyzer, it not only performs more excellently on the conventional plating, but also better meets the needs of non-contact micro-area coating thickness testing in industries such as semiconductor, chip and PCB.
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FTIR, Raman and XRF Analyzer Spectrophotometer  Drawell DWFTIR530Pro FTIR
Spectrophotometer - Drawell DW-FTIR-530Pro FT-IR
Based on more than thirty years’ experience in FTIR R&D and manufacturing, DRAWELL has launched a new type of FTIR Spectrometer DW-FTIR-530Pro with fully independent intellectual property rights. Adhering to consistent excellent quality and superior performance, the new model obtains the best balance between intelligence and convenient operation, advance performance and low operation and maintenance cost. It is a good choice for basic science research analysis, production quality control,testing and detection in various fields.
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FTIR, Raman and XRF Analyzer Portable RamanSpectroscopy  Metrohm MIRA XTR Basic
Portable Raman-Spectroscopy – Metrohm MIRA XTR Basic
The Metrohm brand stands for highly accurate, robust instruments and continuous innovation. Our spectroscopy portfolio reflects these standards. We have cutting-edge near-infrared and Raman systems for lab, process, and field operation. Our solutions are as diverse as the spectroscopy market – learn more about our instruments and innovations below.

MIRA XTR is an alternative for high power 1064 nm systems. Powered by advanced computational processing, MIRA XTR uses a more sensitive 785 nm laser light along with XTR algorithms to eXTRact the Raman data from the sample fluorescence. MIRA XTR also features Orbital Raster Scanning (ORS) to provide better coverage of the sample increasing the accuracy of the results. The Basic package is a starter package that contains the basic components required for operating the MIRA XTR. The Basic package includes Calibration Standard, Intelligent Universal Attachment, and the library of Illicit Materials. Class 3B operation.
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FTIR, Raman and XRF Analyzer Portable RamanSpectroscopy  Metrohm MIRA XTR Advanced
Portable Raman-Spectroscopy – Metrohm MIRA XTR Advanced
The Metrohm brand stands for highly accurate, robust instruments and continuous innovation. Our spectroscopy portfolio reflects these standards. We have cutting-edge near-infrared and Raman systems for lab, process, and field operation. Our solutions are as diverse as the spectroscopy market – learn more about our instruments and innovations below.

MIRA XTR is an alternative for high power 1064 nm systems. Powered by advanced AI and Machine Learning, MIRA XTR uses a more sensitive 785 nm laser along with XTR algorithms to eXTRact the Raman data from the sample fluorescence. MIRA XTR also features Orbital Raster Scanning (ORS) to provide better coverage of the sample increasing the accuracy of the results. The Advanced package includes MIRA Lib KnowItAllTM Full Raman Library Collection of over 19,500 samples, MIRA XTR Raman spectral library for Illicit Materials, Calibration Standard, Intelligent Universal Attachment, Right-angle Attachment, Vial Attachment, and MIRA SERS Attachment. A complete package for any type of analysis. Class 3B operation.
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FTIR, Raman and XRF Analyzer Portable LIBS Analyzer  SciAps Z901
Portable LIBS Analyzer – SciAps Z901
The Z-901 features an all-new ergonomic design, a 0.5 lb. weight reduction down to about 3.5 lbs. (1.6 kg), improved heat dissipation, and completely updated software and processing electronics. General alloy testing for scrap sorting, PMI/NDT or quality assurance. Does not measure carbon. The Z-901 also leads the way featuring the first-ever “dual burn” technology. Users can test with the 901 either using an “air burn” method or using argon-purge for applications requiring higher precision and lower limits of detection.

A single spectrometer to covers the wavelength range of 200 – 440 nm. The instrument is factory calibrated for a suite of 15-20 elements, depending on application. Or operators may use the accompanying Profile Builder software package to customize to specific elements, their own calibration standards, and spectral processing. The Z-901 can be set up to measure the emissions of any element except Li, Na, H, C, N, O, Cl, Br, F, Ce, Rb, S. Common factory-calibrated Z-901 applications include alloy, mining and environmental analysis, typically for beryllium in soil.
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