Product

Home

/ FTIR, Raman and XRF Analyzer

Spectrophotometer - Drawell Desktop XRF EDX2000A

Category :
FTIR, Raman and XRF Analyzer

Price :

Rp.123

Chat Us

DESCRIPTION
SPECIFICATION

EDX2000A Automatic Micro-area Film Thickness Analyzer is a top-illuminate film thickness tester specially developed by Drawell, which best exemplifies its multiple years of layer film thickness measurement technology. Compared with the traditional coating thickness analyzer, it not only performs more excellently on the conventional plating, but also better meets the needs of non-contact micro-area coating thickness testing in industries such as semiconductor, chip and PCB.

Spesifikasi:
Measurable range of coating: 3Li~92U
Element detection range: 13AI~92U
Number of elements to bedetected simultaneously: 24 elements, and more
than five coatings can be analyzed at the same time
Detection limit: The thinnest metal coating can reach 0.005μm
Thickness range : Analysis coating thickness is generally within
50μm(variable for different materials)
Standard deviation of thickness: RSD<3%
Content test range: 0.1%–99.99%
Content detection accuracy: 0.5%
Content stability: The repeatability of multiple measurements can reach 0.5%
Detection time : 5-40 seconds
Lifting range of Z-axis of platform: 0~140mm
Detector and resolution: 25mm²Be window Fast- SDD semiconductor detector with resolution140±5eV
Multichannl analyser: DMCA digital multi-channel analysis
technology with 4096 channels
Collimator: Optional 0.1*0.3mm,φ0.2mm,φ0.3mm,φ0.5mm and other apertures
Minimum test area: 0.02mm²
Sample observation: Equipped with CCD colorful camera,
the image can be magnified up to 25 times, which can realize clear positioning of tiny samples
Sample moving platform: Full-automatic high-precision multi-point TEST XY mobile platform
Focus: Laser adjustment of height with variable camera focusing
Analytical method: Energy Dispersive X-ray Fluorescence Analysis Method combining FP and EC Methods
Security : Dual safety protection facilities:anti-collision laser detector and sensor detecting sample chamber cover opening and closing; There is no radiation in standby mode, the radiation level during operation is far lower than the international safety standard, and it is equipped with software interlocking device.
Dimensions: 485(W)×588(D)×505(H)mm
Sample chamber dimensions: 430(W)×400(D)×140(H)mm
Ambient temperature and humidity: 15℃~30℃,≤70%
Operating power supply: AC 220V±5V, it is recommended to configure AC purified regulated power supply
Instrument weight: 60kg

More From FTIR, Raman and XRF Analyzer

Benchtop XRF Analyzer – Olympus Evident Vanta GX

Benchtop X-ray fluorescence (XRF) analyzers are compact and stylish for the consumer showroom environment. Our benchtop XRF analyzers include precious metal analyzers for proving the purity and composition of gold, silver, jewelry, coins, watches, and other valuable objects. Benchtop XRF analyzers are used by jewelry stores and pawn shops to accurately price the valuables they buy and sell. Using a simple and safe testing process, these analyzers deliver precious metal content, karatage, and fineness in seconds without damaging valuables. Verify authentic jewelry made of gold, silver, palladium, platinum, and other precious metals on the spot.

Rp.123

See Details

Portable XRF Analyzer – Olympus Evident Vanta Element

Evident offers a range of compact, handheld, and benchtop X-ray fluorescence (XRF) analyzers to bring the analysis to where you need it. Our analyzers provide fast, accurate, and nondestructive elemental analysis. Portable XRF analysis can be used on location in various industries, bringing laboratory-quality results to the field. The speed of XRF also makes it perfect for automated or continuous testing on the production line. We offer analyzers purpose-built for in-line inspection. All our analyzers offer speed, power, ease of use, and accuracy for a wide range of material characterization applications.

Rp.123

See Details