Product

Home

/ FTIR, Raman and XRF Analyzer

Portable LIBS Carbon and Silicone Analyzer - SciAps Z901 CSi

Category :
FTIR, Raman and XRF Analyzer

Price :

Rp.123

Chat Us

DESCRIPTION
SPECIFICATION

Now widely accepted for carbon testing: SciAps breakthrough LIBS analyzer is included in API 578 2nd Edition, accepted at every major refinery and in use worldwide by fabricators, pipeline integrity management programs, power plants and other users of carbon steels and L- and H-grade stainless. An alternative to spark OES, handheld LIBS analyzers use a miniature laser to measure what X-ray can’t: Li, Be, B, C, F, Na and more. For industries that focus on carbon content in steels and stainless, the CSi offers a dedicated solution. Features include advanced spectrometer design for high resolution and wide range, 190-260 nm, and microanalysis capability with 100 um laser spot size. Meets multi-test averaging protocols.

Display : 2.7″ high brightness, color touchscreen, readable in all lighting conditions. Rear facing display for easy results viewing.
Power : On-board rechargeable Li-ion battery, rechargeable inside device or with external charger, AC power.
Processing electronics : ARM Quad Cortex -A53 1.2 GHz Memory: 2 GB LPDDR3, eMMC 16 GB
Data storage : Results Storage: 32 GB SD card
Connectivity : Built on Google’s Android platform for real-time data exporting, including built-in WiFi (IEEE 802.11b/g/n), Bluetooth (BR/EDR+BLE), GPS and USB-C to connect to virtually any information management system.
Sample viewing : Integrated camera and laser target indicator for viewing sample before and during analysis for proper sample alignment. Includes second “macro camera” for scanning QR or bar codes and for photo-documentation and report generation.
Laser raster : On-board Y stage for rastering laser to discrete locations for targeted analysis or averaging.
Atmosphere : SciAps proprietary Opti-Purge provides an inert argon environment improving spectral signal to noise ratio and improving performance in the UV range.
Calibration check : 316 stainless steel standard for automated calibration and wavelength scale validation.
Drift correction : On-board automated drift correction software with factory-provided or user-provided reference materials.
Regulatory : CE, RoHS, USFDA registered. Class 3b laser. Sample sensor on board, allows for operation under Class 1 conditions, subject to local LSO approval.
Spectral range : 190 – 260 nm
Calibrations :
Low Alloy Steel: C (0.008 to 1.25%), Si
Stainless Steel: C (0.0075 to 0.25%)
Security : Password protected; Multi-user support with configurable access settings
Dimensions : 10.75" x 2.375" x 8.625"
Weight : 3.87 lbs. with battery

More From FTIR, Raman and XRF Analyzer

Benchtop XRF Analyzer – Olympus Evident Vanta GX

Benchtop X-ray fluorescence (XRF) analyzers are compact and stylish for the consumer showroom environment. Our benchtop XRF analyzers include precious metal analyzers for proving the purity and composition of gold, silver, jewelry, coins, watches, and other valuable objects. Benchtop XRF analyzers are used by jewelry stores and pawn shops to accurately price the valuables they buy and sell. Using a simple and safe testing process, these analyzers deliver precious metal content, karatage, and fineness in seconds without damaging valuables. Verify authentic jewelry made of gold, silver, palladium, platinum, and other precious metals on the spot.

Rp.123

See Details

Portable XRF Analyzer – Olympus Evident Vanta Element

Evident offers a range of compact, handheld, and benchtop X-ray fluorescence (XRF) analyzers to bring the analysis to where you need it. Our analyzers provide fast, accurate, and nondestructive elemental analysis. Portable XRF analysis can be used on location in various industries, bringing laboratory-quality results to the field. The speed of XRF also makes it perfect for automated or continuous testing on the production line. We offer analyzers purpose-built for in-line inspection. All our analyzers offer speed, power, ease of use, and accuracy for a wide range of material characterization applications.

Rp.123

See Details