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$FTIR, Raman and XRF Analyzer Spectrophotometer - Drawell DW-XRD-Y3500 X-ray Diffractometer 1 dw_xrd_y3500_x_ray_diffractometer$

Spectrophotometer - Drawell DW-XRD-Y3500 X-ray Diffractometer

Category :
FTIR, Raman and XRF Analyzer

Price :

Rp.123

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DESCRIPTION
SPECIFICATION

The new high-end X-ray diffractometer (XRD) is a domestic high-performance and high-precision XRD, which is the project of the National Development and Reform Commission. With advanced core technology, it can accurately do qualitative and quantitative phase analysis of metal and non-metallic polycrystalline samples. It can be mainly used in qualitative or quantitative analysis, crystal structure analysis, material structure analysis, macroscopic or microscopic stress determination, crystal size determination, crystal size determination, crystallinity determination, etc., therefore, It is widely used in many disciplines and industries: materials science, physics, chemistry, chemical industry, metallurgy, minerals, drugs, building materials, ceramics, etc.

Spesifikasi:
Maximum output power: 3kW
Tube voltage: 10 ~ 60KV, 1kV/step
Tube current: 5 ~ 50mA, 1mA/step
Beam voltage stability: Better than ±0.005% (when the external voltage fluctuates 10%)
X-ray tube: Metal-body ceramic X-ray tube
Focus size: Focus 1×10mm
Standard target: Cu target (other target is optional)
Ray tube power: 2.4kW
Diffraction circle radius: 180mm ~ 300mm
Scanning mode: continuous, step-by-step
2θ Measuring range: -110°~ 168°
Minimum step Angle: 0.0001°
Maximum rotational speed: 20°/s
Diffraction Angle measurement linearity: ≤0.01°
Full spectrum Angle measurement accuracy: ±0.005°
Beam size: 180×180μm
Resolution: ≤0.028° (2θ center)
Repeatability error: ±0.0001°
Angle reproducibility: 0.0001°
Maximum positioning speed: ≤1200°/min
Diffraction angular linearity: The angular deviation of all peaks in the full spectrum does not exceed ±0.01°.
Overall dimensions: 1320×1150×1860mm

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